G100 is a high-speed measurement system that uses fringe reflection technology. It generates a profile using the slope of each pixel measured by a 2D camera images. The system employs a surface shape inspection method suitable for inspecting large areas (160 mm x 120 mm or more). Its use of multiple cameras allows for the quick expansion of the inspection area and various applications.
N200 is a high-resolution inspection system that is more powerful than a microscope and can achieve a lateral resolution of 0.46~3.0 ㎛. It can create a 3 dimensional profile, measured at the nanometer level. The system is compact in appearance and is easy to use, allowing it to effectively replace existent optical microscopes based inspection systems.
